Nikon Metrology / Products / X-ray and CT Inspection / X-ray systems for electronics inspection / XT V 160R versatile X-ray system

XT V 160R

The XT V 160R versatile X-ray system has been discontinued.

Overview

XT V 160R for semiconductor  inspection

XT V 160R

The XT V 160R is a versatile microfocus X-ray analysis system for both manual and programmed inspection of samples that demand the highest level of contrast sensitivity.

The XT 160 R fitted with a reflection target X-ray source has been developed in direct response to customer requirements and primarily aims at the semiconductor packaging applications for package void inspection.

Key benefits

  • High contrast sensitivity
  • Low energy imaging capability
  • High resolution micron level features
  • Advanced ergonomics
  • Viewing from any angle
  • Low cost of ownership

Learn more

Categories: X-ray systems for electronics inspection

Applications: Automated measurement, Telecom & Electronics, X-ray inspection of BGA, wirebonds, MEMS, loaded PCB, Mobile phones, shavers & watches