Nikon Metrology / Products / X-ray and CT Inspection / X-ray systems for electronics inspection / XT V 130C Electronics X-ray system

XT V 130C Electronics X-ray inspection system

Overview

XT V 130C  -  Cost-effective X-ray inspection of electronic components

XTV130C

The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130kv/10 watt  Nikon Metrology manufactured source, a globally recognized open tube design with integrated generator, and a high-resolution imaging chain.

Through a series of factory and field upgrades, the end-user can configure these systems to its own needs with a higher power source, a rotating sample tray, automatic inspection software, a digital flat panel option, and the ability to add future-proof CT technology.

Key benefits

  • Proprietary 30-130kv micro-focus source with 2μm feature recognition
  • True 75° manipulator tilting angle allows oblique viewing for easy inspection of internal features
  • Large measurement area of 406x406mm
  • Intuitive joystick navigation drives real-time X-ray imaging
  • Dual display for combined measurement and real-time analysis
  • Low cost of ownership and maintenance with open-tube technology
  • Safety as a design criterion
  • CT ready

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Categories: X-ray systems for electronics inspection

Applications: X-ray inspection of BGA, wirebonds, MEMS, loaded PCB