Available in Americas only
A compact solution for 300mm wafer inspection in diverse applications.
Engineered to provide cost-effective support for 300mm wafers with a minimal footprint, the Optistation-3100 features an advanced micro/macro system in a compact, flexible design. The optical system offers brighter images, and observation techniques can be programmed for each objective magnification and each substrate layer to be inspected.
Categories: Semiconductor Equipment