Nikon Metrology / Products / X-ray and CT Inspection / Configurable X-ray / CT Systems

Configurable X-ray / CT Systems

Nikon Metrology’s configurable X-ray/CT systems offer a larger inspection envelope than is available in the standard Nikon cabinet products. These modular systems support multiple sources, multiple detectors and can be custom-configured to fit a variety of applications. These configurable CT systems can be built into (existing ) cabinets or walk-in rooms. As such you can configure your X-ray / CT facilities to your needs or even upgrade existing facilities with the latest X-ray/CT technology.

Nikon Metrology partners with Avonix Imaging who supplies different sized frames and manipulators. The core of these configurable systems are the Nikon in house-built microfocus sources of 160 kV, 225 kV, 320 kV, and 450 kV. The focal spot size of these microfocus sources is orders-of-magnitude smaller when compared to minifocus sources, which results in superior resolution and accuracy. The larger source offer sufficient X-ray energy to penetrate dense or larger parts.

Products

  • M1 Configurable X-Ray/CT Inspection System
    M1 Configurable X-Ray/CT Inspection System

    The M1 system is an economical, large-envelope configurable CT inspection system. The perimeter frame and cantilevered sample stage allows for free and clear access around the sample stage for ease of sample setup.

  • M2 high-precision X-ray CT inspection system
    M2 high-precision X-ray CT inspection system

    The M2 system is a high-precision large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 8 axis manipulator.

  • C2 Extra large-envelope X-ray/CT inspection system
    C2 Extra large-envelope X-ray/CT inspection system

    The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator.