Nikon Metrology’s configurable X-ray/CT systems offer a larger inspection envelope than is available in the standard Nikon cabinet products. These modular systems support multiple sources, multiple detectors and can be custom-configured to fit a variety of applications. These configurable CT systems can be built into (existing ) cabinets or walk-in rooms. As such you can configure your X-ray / CT facilities to your needs or even upgrade existing facilities with the latest X-ray/CT technology.
Nikon Metrology partners with Avonix Imaging who supplies different sized frames and manipulators. The core of these configurable systems are the Nikon in house-built microfocus sources of 160 kV, 225 kV, 320 kV, and 450 kV. The focal spot size of these microfocus sources is orders-of-magnitude smaller when compared to minifocus sources, which results in superior resolution and accuracy. The larger source offer sufficient X-ray energy to penetrate dense or larger parts.
The M1 system is an economical, large-envelope configurable CT inspection system. The perimeter frame and cantilevered sample stage allows for free and clear access around the sample stage for ease of sample setup.
The M2 system is a high-precision large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 8 axis manipulator.
The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator.