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Inspect-X 5.0 enables higher resolution scans for an improved insight into defects

January 26, 2016

Logo Inspect-X

Nikon Metrology introduces Inspect-X 5.0, the latest release of the acquisition and analysis software for Nikon Metrology’s range of X-ray and CT systems. Inspect-X 5.0 is now a native 64-bit application and supports a new 16Mpixel flat panel detector enabling much higher resolution CT scans. Another new feature is the Golden Image Comparison tool, enabling operators to intelligently and immediately make a pass/fail sentence on the part being inspected.

Introducing an all-new 64-bit platform

Inspect-X 5.0 is now anative 64-bit application,enabling the support of the higher resolution detectors that offer sharper and clearer images. Also, the 64-bit system achieves faster processing and analysis, offering quicker insight and higher productivity.

Higher resolution CT scanning

Flat panel detector

Inspect-X 5.0 now supports a new 16 MPixel detector with pixels as small as 100 µm; this is 4x better resolution than current comparable panels. With a much more detailed inspection, the high resolution imaging reveals all defects contributing to a greater insight. The new supported panel is available for the XT H 225 ST, XT H 320 and XT H 450 CT systems.

Comparison of the golden image and live radiograph during automated inspection

Another new feature in Inspect-X 5.0, is the Golden Image Comparison tool that automatically displays a reference image alongside a radiograph image during an automated (electronics) inspection routine. This allows operators to intelligently and immediately make a pass/fail sentence on the part being inspected.